Accelerometers for vibration measurements & wireless condition monitoring

5 May, 2017

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Graham Prophet @ eedesignnewseurope.com discuss about two new MEMS accelerometers from Analog Devices:

Analog Devices (ADI) has added two devices to its low noise, low drift, low power, three-axis MEMS accelerometers. The low noise performance over high frequencies provided by the ADXL356 and ADXL357 MEMS accelerometers delivers high resolution vibration measurements that enable the early detection of machine failure in condition monitoring applications.

Accelerometers for vibration measurements & wireless condition monitoring – [Link]

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Mike is the founder and editor of Electronics-Lab.com, an electronics engineering community/news and project sharing platform. He studied Electronics and Physics and enjoys everything that has moving electrons and fun. His interests lying on solar cells, microcontrollers and switchmode power supplies. Feel free to reach him for feedback, random tips or just to say hello :-)

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