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1 November, 2016

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ADXL354 - MEMS ICs detect structural defects

Three-axis MEMS accelerometers, Analog Devices’ ADXL354 and ADXL355 perform high-resolution vibration measurement to enable the early detection of structural defects via wireless sensor networks. The low power consumption of the devices lengthens battery life and reduces the time between batte... Read More

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