Tag: ADXL355

ADXL354 – MEMS ICs detect structural defects
Sensor

ADXL354 – MEMS ICs detect structural defects

Three-axis MEMS accelerometers, Analog Devices’ ADXL354 and ADXL355 perform high-resolution vibration measurement to enable the early detection of structural defects via wireless sensor networks. The low power consumption of the devices lengthens battery life and reduces the time...

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