Tag: thermal
Thermal Cutoff Overtemperature (TCO) Protection Devices – AD & SD Series
Bourns' TCO mini-breaker devices are tested to AEC-Q200-listed stress tests AD and SD series resettable miniature thermal cutoff (TCO) mini-breaker devices from Bourns, Inc. are the first TCO devices tested by Bourns to AEC-Q200-listed stress tests. The AD and SD series’ advanced...
Continue ReadingHow to Select a Heat Sink Video from Cuidevices.com
Heat sinks play an important role in circuit design, providing an efficient path for heat to be transferred into the ambient air and away from electronic devices. Without them, many electronics such as BJTs, MOSFETs, linear regulators, BGA packages, and so on are more likely to...
Continue ReadingThermal-imaging DMM, in distribution
Distributor Conrad Business Supplies has the thermal multimeter 279 FC from Fluke, that combines a thermal imager with a fully-featured true RMS digital multimeter to enable faster and more thorough troubleshooting with a single tool. By Graham Prophet@...
Continue ReadingFLIR MR160 Thermal Imaging & Moisture Meter Review, Teardown & Experiments
The Signal Path Blog published another video reviewing FLIR MR160 Thermal Imaging & Moisture Meter: In this episode Shahriar takes a close look at the FLIR MR160 Thermal Imaging and Moisture Meter. Featuring Infrared Guided Measurement (IGM) technology powered by a FLIR...
Continue ReadingDIY-Thermocam – an open-source, do-it-yourself thermographic camera
Max Ritter has pointed us to his latest project, the DIY-Thermocam, a open source thermal imager based on FLIR thermal sensor. The results are awesome! The device is based on the popular FLIR Lepton thermal sensor and uses a Teensy 3.2 mikrocontroller to display live thermal images...
Continue ReadingApp Note: Heat sink mounting guide
Fairchild Semiconductor’s app note on proper heat sink mounting to achieve lower thermal resistance between the package and its heat sink. Link here (PDF) This document provides guidelines for mounting heat sinks for the proper thermal management of power semiconductor devices in...
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